Selected Publications
Schaller R, Hyman M, Supple G, Santangeli P, Riley M, Nazarian S, Arkles J, Garcia J, Lin D, Guandalini G, Kumareswaran R, Deo R, Bode W, Markman T, Epstein A, Callans D, Dixit S, Brozoski J, Marchlinski F, Frankel D: Defibrillation testing of the subcutaneous implantable cardioverter-defibrillator at the time of generator replacement Heart Rhythm S1547-5271 (23): 02781-9,2023.
Dhakal B, Patel N, Garg L, Frankel D, Hyman M, Guandalini GS, Supple G, Nazarian S, Kumareswaran R, Riley M, Santangeli P, Lin D, Callans D, Arkles J, Schaller R, Tschabrunn C, Zado E, Marchlinski F, Dixit S.: Utility of very high output pacing to identify VT circuits in patients manifesting traditionally inexcitable scar. JACC: Clinical Electrophysiology S2405-500x (23): 00628-X,2023.
Markman T, Peters C, Tate S, Guandalini G, Hyman M, Schaller R, Supple G, Riley M, Garcia F, Nazarian S, Lin D, Dixit S, Epstein A, Callans D, Marchlinski F, Frankel D: Accuracy of symptoms and pulse checking for detecting atrial fibrillation following catheter ablation Journal of Interventional Cardiac Electrophysiology : 2023.
Tan JL, Guandalini GS, Hyman MC, Arkles J, Santangeli P, Schaller RD, Garcia F, Supple G, Frankel DS, Nazarian S, Lin D, Callans D, Marchlinski FE, Markman TM: Substrate and arrhythmia characterization using the multi-electrode Optrell mapping catheter for ventricular arrhythmia ablation – a single-center experience Journal of Interventional Cardiac Electrophysiology : 2023.
Thind M, Arceluz M, Lucena-Padros I, Kubala M, Mirwais M, Bode W, Cerantola M, Sugrue A, Van Niekerk C, Vigdor A, Patel N, AlSalem A, Zado E, Kumareswaren R, Lin D, Arkles J, Garcia F, Guandalini G, Markman T, Riley M, Deo R, Schaller R, Nazarian S, Dixit S, Epstein A, Supple G, Frankel D, Tschabrunn C, Santangeli P, Callans D, Hyman M, Marchlinski F.: Identifying origin of non-pulmonary vein triggers using 2 stationary linear decapolar catheters: a novel algorithm. JACC: Clinical Electrophysiology S2405-500X (23): 00533-9,2023.
Arceluz M, Thind M, Hambach B, Garcia F, Callans D, Guandalini G, Frankel D, Supple G, Hyman M, Schaller R, Nazarian S, Dixit S, Lin D, Marchlinski F, Santangeli P.: Septal substrate ablation guided by delayed transmural conduction times: a novel ablation approach to target intramural substrates. JACC: Clinical Electrophysiology 5 (7): 789-800,2023.
Arceluz MR, Thind M, Garcia FC, Guandalini GS, Santangeli P, Hyman M, Deo R, Frankel DS, Supple GE, Schaller RD, Callans DJ, Nazarian S, Dixit S, Kumareswaran R, Zado ES, Marchlinski FE.: Sinus rhythm electrocardiographic abnormalities, sites of origin, and ablation outcomes of ventricular premature depolarizations initiating ventricular fibrillation. Heart Rhythm : 2023.
Guandalini GS.: Intramyocardial mapping of ventricular arrhythmias via septal venous perforators: Defining the superior intraseptal space. Cardiac Electrophysiology Clinics 15 (1): 39-47,2023.
Eberly LA, Lin A, Park J, Khoshnab M, Garg L, Chee J, Kallan MJ, Walsh K, Supple GE, Schaller RD, Santangeli P, Riley MP, Nazarian S, Arkles J, Hyman M, Lin D, Guandalini G, Kumareswaran R, Deo R, Zado ES, Epstein A, Frankel DS, Callans DJ, Marchlinski FE, Dixit S.: Presence of sinus rhythm at time of ablation in patients with persistent atrial fibrillation undergoing pulmonary vein isolation is associated with improved long-term arrhythmia outcomes. Journal of Interventional Cardiac Electrophysiology 66 (6): 1455-1464,2023.
Chee J, Lin AN, Julien H, Lin D, Schaller RD, Frankel DS, Supple GE, Santangeli P, Riley MP, Nazarian S, Deo R, Arkles J, Kumareswaran R, Hyman MC, Guandalini G, Epstein AE, Zado ES, Callans DJ, Marchlinski FE, Dixit S.: Impact of left ventricular papillary muscle ventricular arrhythmia ablation on mitral valve function. JACC: Clinical Electrophysiology 8 (12): 1475-1483,2022.
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Academic Contact Information
The Pavilion at the Hospital of the University of Pennsylvania
Level 2/City Side, Cardiac Electrophysiology Program
One Convention Avenue
Philadelphia,
PA
19104
Phone: 215-614-1889
Patient appointments: 800-789-7366